Corvane Semiconductor · Quality
Investigations
Opened automatically when Macro detects a change that matters, or manually by your team.
All investigations
3 this month| ID | Investigation | Severity | Status | Opened | Owner | Actions |
|---|---|---|---|---|---|---|
| INV-0142 | CV-7 first-pass yield decline: Bin 7 continuity failuresCV-7 | High | Investigating | Oct 6 · 18:40 | Priya Raman | Open |
| INV-0139 | CX-12 VOUT offset drifting toward upper spec limit on tester T-02CX-12 | Medium | Monitoring | Oct 2 · 11:05 | Wei Zhang | |
| INV-0137 | CV-5 retest rate elevated on handler H-3CV-5 | Low | Resolved | Sep 24 · 09:30 | Wei Zhang |